dc.contributor.author |
Kumar, Pardeep |
|
dc.contributor.author |
Joshi, Tanmay |
|
dc.contributor.author |
Joglekar, Radhika |
|
dc.contributor.author |
Mohapatra, Nihar Ranjan |
|
dc.contributor.other |
8th IEEE Electron Devices Technology and Manufacturing Conference (EDTM 2024) |
|
dc.coverage.spatial |
India |
|
dc.date.accessioned |
2024-05-16T14:32:40Z |
|
dc.date.available |
2024-05-16T14:32:40Z |
|
dc.date.issued |
2024-03-03 |
|
dc.identifier.citation |
Kumar, Pardeep; Joshi, Tanmay; Joglekar, Radhika and Mohapatra, Nihar Ranjan, "ComputLitho - an indigenous optical lithography simulator with novel features", in the 8th IEEE Electron Devices Technology and Manufacturing Conference (EDTM 2024), Bangalore, IN, Mar. 03-06, 2024. |
|
dc.identifier.uri |
https://doi.org/10.1109/EDTM58488.2024.10511904 |
|
dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/10051 |
|
dc.description.abstract |
This paper introduces a new optical lithography simulator, ComputLitho, that leverages the advanced algorithms and computational techniques to model the complex process of lithography, providing unprecedented insights into the mask corrections. This innovative tool enables prediction and optimization of lithographic processes with a very high precision, thereby facilitating mask corrections for accelerating process development and yield ramp in semiconductor device manufacturing. ComputLitho’s userfriendly interface and robust performance make it an invaluable resource for researchers and engineers in semiconductor industry. |
|
dc.description.statementofresponsibility |
by Pardeep Kumar, Tanmay Joshi, Radhika Joglekar and Nihar Ranjan Mohapatra |
|
dc.language.iso |
en_US |
|
dc.publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
|
dc.subject |
Optical lithography simulator |
|
dc.subject |
Aerial image |
|
dc.subject |
Resist image |
|
dc.subject |
OPC |
|
dc.subject |
Hotspot |
|
dc.subject |
Mask optimization |
|
dc.title |
ComputLitho - an indigenous optical lithography simulator with novel features |
|
dc.type |
Conference Paper |
|