Fault tolerance of oscillatory neural network using PMO oscillator

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dc.contributor.author Shubham, Sai
dc.contributor.author Mohanty, Siddharth
dc.contributor.author Lashkare, Sandip
dc.contributor.other 8th IEEE Electron Devices Technology and Manufacturing Conference (EDTM 2024)
dc.coverage.spatial India
dc.date.accessioned 2024-05-16T14:32:41Z
dc.date.available 2024-05-16T14:32:41Z
dc.date.issued 2024-03-03
dc.identifier.citation Shubham, Sai; Mohanty, Siddharth and Lashkare, Sandip, "Fault tolerance of oscillatory neural network using PMO oscillator", in the 8th IEEE Electron Devices Technology and Manufacturing Conference (EDTM 2024), Bangalore, IN, Mar. 03-06, 2024.
dc.identifier.uri https://doi.org/10.1109/EDTM58488.2024.10512018
dc.identifier.uri https://repository.iitgn.ac.in/handle/123456789/10057
dc.description.abstract Oscillatory Neural Networks (ONN) are inevitable when it comes to solving combinatorial optimization problems. This work demonstrates the fault tolerance of the ONN in solving vertex coloring problems in a 4-node network in various configurations at multiple failure levels of the different components of the oscillator. This work validates the network to be extremely robust to failures (limited to 4 nodes), showing tolerance in variations in resistance and capacitances up to 90% and 50% respectively.
dc.description.statementofresponsibility by Sai Shubham, Siddharth Mohanty and Sandip Lashkare
dc.language.iso en_US
dc.publisher Institute of Electrical and Electronics Engineers (IEEE)
dc.subject Oscillatory neural network (ONN)
dc.subject Failure analysis
dc.subject Vertex coloring
dc.subject PMO oscillator
dc.title Fault tolerance of oscillatory neural network using PMO oscillator
dc.type Conference Paper


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