dc.contributor.author |
Shubham, Sai |
|
dc.contributor.author |
Mohanty, Siddharth |
|
dc.contributor.author |
Lashkare, Sandip |
|
dc.contributor.other |
8th IEEE Electron Devices Technology and Manufacturing Conference (EDTM 2024) |
|
dc.coverage.spatial |
India |
|
dc.date.accessioned |
2024-05-16T14:32:41Z |
|
dc.date.available |
2024-05-16T14:32:41Z |
|
dc.date.issued |
2024-03-03 |
|
dc.identifier.citation |
Shubham, Sai; Mohanty, Siddharth and Lashkare, Sandip, "Fault tolerance of oscillatory neural network using PMO oscillator", in the 8th IEEE Electron Devices Technology and Manufacturing Conference (EDTM 2024), Bangalore, IN, Mar. 03-06, 2024. |
|
dc.identifier.uri |
https://doi.org/10.1109/EDTM58488.2024.10512018 |
|
dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/10057 |
|
dc.description.abstract |
Oscillatory Neural Networks (ONN) are inevitable when it comes to solving combinatorial optimization problems. This work demonstrates the fault tolerance of the ONN in solving vertex coloring problems in a 4-node network in various configurations at multiple failure levels of the different components of the oscillator. This work validates the network to be extremely robust to failures (limited to 4 nodes), showing tolerance in variations in resistance and capacitances up to 90% and 50% respectively. |
|
dc.description.statementofresponsibility |
by Sai Shubham, Siddharth Mohanty and Sandip Lashkare |
|
dc.language.iso |
en_US |
|
dc.publisher |
Institute of Electrical and Electronics Engineers (IEEE) |
|
dc.subject |
Oscillatory neural network (ONN) |
|
dc.subject |
Failure analysis |
|
dc.subject |
Vertex coloring |
|
dc.subject |
PMO oscillator |
|
dc.title |
Fault tolerance of oscillatory neural network using PMO oscillator |
|
dc.type |
Conference Paper |
|