Polarized Raman analysis at low temperature to examine interface phonons in InAs/GaAs1-xSbx quantum dot heterostructures

Show simple item record

dc.contributor.author Kumar, Priyesh
dc.contributor.author Deb, Sudip Kumar
dc.contributor.author Chakrabarti, Subhananda
dc.contributor.author Saha, Jhuma
dc.coverage.spatial United States of America
dc.date.accessioned 2024-09-27T09:29:33Z
dc.date.available 2024-09-27T09:29:33Z
dc.date.issued 2024-09
dc.identifier.citation Kumar, Priyesh; Deb, Sudip Kumar; Chakrabarti, Subhananda and Saha, Jhuma, "Polarized Raman analysis at low temperature to examine interface phonons in InAs/GaAs1-xSbx quantum dot heterostructures", arXiv, Cornell University Library, DOI: arXiv:2409.09631, Sep. 2024.
dc.identifier.uri http://arxiv.org/abs/2409.09631
dc.identifier.uri https://repository.iitgn.ac.in/handle/123456789/10602
dc.description.abstract An experimental study of optical phonon modes, both normal and interface (IF) phonons, in bilayer strain-coupled InAs/GaAs_(1-x)Sb_x quantum dot heterostructures has been presented by means of low-temperature polarized Raman scattering. The effect of Sb-content on the frequency positions of these phonon modes has been very well correlated with the simulated strain. The Raman peaks show different frequency shifts in the heterostructure with varying Sb-content in the capping layer. This shift is attributed to the strain relaxation, bigger size of quantum dots and type-II band alignment.
dc.description.statementofresponsibility by Priyesh Kumar, Sudip Kumar Deb, Subhananda Chakrabarti and Jhuma Saha
dc.language.iso en_US
dc.publisher Cornell University Library
dc.title Polarized Raman analysis at low temperature to examine interface phonons in InAs/GaAs1-xSbx quantum dot heterostructures
dc.type Article
dc.relation.journal arXiv


Files in this item

Files Size Format View

There are no files associated with this item.

This item appears in the following Collection(s)

Show simple item record

Search Digital Repository


Browse

My Account