Experimental characterization of fabricated (310) and (210) symmetrical tilt high-angle grain boundaries in bicrystalline copper thin films using NaCl substrates

Experimental characterization of fabricated (310) and (210) symmetrical tilt high-angle grain boundaries in bicrystalline copper thin films using NaCl substrates

Dish, Nilabh; Gautam, Abhay Raj Singh; Behera, Rakesh; Banka, Hemasunder; Chavan, Pradeep
URI: https://repository.iitgn.ac.in/handle/123456789/10822
Date: 2025-02-07

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