| dc.contributor.author |
Kaur, Raminder |
|
| dc.contributor.author |
Surana, Neelam |
|
| dc.contributor.author |
Mekie, Joycee |
|
| dc.contributor.other |
IEEE International conference on Radiation effects on Electronic Components and Systems (RADECS 2016) |
|
| dc.coverage.spatial |
Bremen, DE |
|
| dc.date.accessioned |
2017-05-09T07:02:19Z |
|
| dc.date.available |
2017-05-09T07:02:19Z |
|
| dc.date.issued |
2016-09-19 |
|
| dc.identifier.citation |
Kaur, Raminder; Surana, Neelam and Mekie, Joycee, "Guarded dual rail logic for soft error tolerant standard cell library", in IEEE International conference on Radiation effects on Electronic Components and Systems (RADECS 2016), Bremen, DE, Sep. 19-23, 2016. |
en_US |
| dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/2916 |
|
| dc.identifier.uri |
http://www.radecs2016.com/joomla/ |
|
| dc.description.statementofresponsibility |
by Raminder Kaur, Neelam Surana and Joycee Mekie |
|
| dc.language.iso |
en_US |
en_US |
| dc.title |
Guarded dual rail logic for soft error tolerant standard cell library |
en_US |
| dc.type |
Presentation |
en_US |