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  • Rapid multi-objective antenna synthesis via deep neural network surrogate-driven evolutionary optimization 
    Singh, Praveen; Panda, Soumyashree S.; Dash, Jogesh C.; Riscob, Bright; Pathak, Surya K.; Hegde, Ravi S. (Institute of Electrical and Electronics Engineers (IEEE), 2025)
    Antenna synthesis is becoming increasingly challenging with tight requirements for C-SWAP (cost, size, weight and power) reduction while maintaining stringent electromagnetic performance specifications. While machine ...
  • On-demand cueing sensitive to step variability: understanding its impact on gait of individuals with Parkinson's Disease 
    Pallavi, Priya; Raghuvanshi, Ankita; Kumar, Suhagiya Dharmik; Patel, Niravkumar; Kanetkar, Manasi; Chhatlani, Rahul; Rana, Manish; Betai, Sagar; Rajan, Roopa; Lahiri, Uttama (Institute of Electrical and Electronics Engineers (IEEE), 2025)
    Parkinson’s disease (PD) is characterized by gait disturbances with freezing of gait (FoG) being one of the most disabling symptoms. The FoG episode is often preceded by an increase in variability in Step Time. As the ...
  • Fault tolerance of oscillatory neural network: device oscillator based small network to digital oscillator based large networks 
    Shubham, Sai; Myanapuri, Nikhilesh; Mohanty, Siddharth; Lashkare, Sandip (Institute of Electrical and Electronics Engineers (IEEE), 2025)
    Oscillatory Neural Networks (ONN) are inevitable when it comes to solving combinatorial optimization problems. ONNs are also extremely energy efficient for AI workloads compared to conventional Deep Neural Networks (DNNs). ...
  • Editorial for the JEDS Special Issue for EDTM 2024 
    Mohapatra, Nihar Ranjan; Tiwari, Shree Prakash; Sahay, Shubham; Nair, Deleep; Das, Saptarshi; Karve, Gauri; Raghavan, Nagarajan; Sebastian, Abu; Sanuki, Tomoya (Institute of Electrical and Electronics Engineers (IEEE), 2025)
    This Special Issue of the IEEE Journal of the Electron Devices Society (J-EDS) features a selection of outstanding papers presented at the 2024 IEEE Electron Devices Technology and Manufacturing (EDTM) Conference. Sponsored ...
  • A soft error self-resilience radiation-hardened 14T SRAM for aerospace applications 
    Anjaneyulu, Guguloth; Panigrahy, Asisa Kumar; Kumar, Mukku Pavan; Haq, Shams Ul; Darabi, Abdolreza; Abbasian, Erfan; Sharma, Priyanka; Prakash, M. Durga (Institute of Electrical and Electronics Engineers (IEEE), 2025)
    Various charged particles in space threaten memory circuit integrity and dependability, including photons, alpha particles, and high-energy ions outside the Low Earth Orbit region. These particles particularly affect ...
  • A scalable Physics-based compact model for terminal charge, intrinsic capacitance and drain current in nanosheet field effect transistors 
    Singh, Aishwarya; Ganeriwala, Mohit D.; Joglekar, Radhika; Mohapatra, Nihar Ranjan (Institute of Electrical and Electronics Engineers (IEEE), 2025)
    This study introduces a physics-based, SPICE-compatible model for Nanosheet Field-Effect Transistors (NsFETs) that offers explicit expressions for the drain current, terminal charges, and intrinsic capacitances applicable ...

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