dc.contributor.author |
Arora, Amit |
|
dc.contributor.author |
Singh, Amit Kumar |
|
dc.contributor.other |
Metallography Contest in the SEM category at the 57th National Metallurgist's Day (NMD) and the 73rd Annual Technical Meeting (ATM) 2019 |
|
dc.coverage.spatial |
Thiruvananthapuram, IN |
|
dc.date.accessioned |
2019-12-03T14:21:44Z |
|
dc.date.available |
2019-12-03T14:21:44Z |
|
dc.date.issued |
2019-11-13 |
|
dc.identifier.citation |
Arora, Amit and Singh, Amit Kumar, "A Scanning Electron Micrography", in the Metallography Contest in the SEM category at the 57th National Metallurgist's Day (NMD) and the 73rd Annual Technical Meeting (ATM) 2019, Thiruvananthapuram, IN, Nov. 13�16, 2019. (Metallography Contest Award) |
en_US |
dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/5000 |
|
dc.description.statementofresponsibility |
by Amit Arora and Amit Kumar Singh |
|
dc.language.iso |
en_US |
en_US |
dc.title |
A Scanning Electron Micrography |
en_US |
dc.type |
Presentation |
en_US |