A Scanning Electron Micrography

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dc.contributor.author Arora, Amit
dc.contributor.author Singh, Amit Kumar
dc.contributor.other Metallography Contest in the SEM category at the 57th National Metallurgist's Day (NMD) and the 73rd Annual Technical Meeting (ATM) 2019
dc.coverage.spatial Thiruvananthapuram, IN
dc.date.accessioned 2019-12-03T14:21:44Z
dc.date.available 2019-12-03T14:21:44Z
dc.date.issued 2019-11-13
dc.identifier.citation Arora, Amit and Singh, Amit Kumar, "A Scanning Electron Micrography", in the Metallography Contest in the SEM category at the 57th National Metallurgist's Day (NMD) and the 73rd Annual Technical Meeting (ATM) 2019, Thiruvananthapuram, IN, Nov. 13�16, 2019. (Metallography Contest Award) en_US
dc.identifier.uri https://repository.iitgn.ac.in/handle/123456789/5000
dc.description.statementofresponsibility by Amit Arora and Amit Kumar Singh
dc.language.iso en_US en_US
dc.title A Scanning Electron Micrography en_US
dc.type Presentation en_US


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