SERAD: Soft Error Resilient Asynchronous Design using a bundled data protocol

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dc.contributor.author Aketi, Sai Aparna
dc.contributor.author Gupta, Smriti
dc.contributor.author Cheng, Huimei
dc.contributor.author Mekie, Joycee
dc.contributor.author Beerel, Peter A.
dc.date.accessioned 2020-05-27T14:12:52Z
dc.date.available 2020-05-27T14:12:52Z
dc.date.issued 2020-05
dc.identifier.citation Aketi, Sai Aparna; Gupta, Smriti; Cheng, Huimei; Mekie, Joycee and Beerel, Peter A., "SERAD: Soft Error Resilient Asynchronous Design using a bundled data protocol", IEEE Transactions on Circuits and Systems I: Regular Papers, DOI: 10.1109/TCSI.2020.2965073, vol. 67, no. 5, pp. 1667-1677, May 2020. en_US
dc.identifier.issn 1549-8328
dc.identifier.uri https://doi.org/10.1109/TCSI.2020.2965073
dc.identifier.uri https://repository.iitgn.ac.in/handle/123456789/5423
dc.description.abstract The risk of soft errors due to radiation continues to be a significant challenge for engineers trying to build systems that can handle harsh environments. Building systems that are Radiation Hardened by Design (RHBD) is the preferred approach, but existing techniques are expensive in terms of performance, power, and/or area. This paper introduces a novel soft-error resilient asynchronous bundled-data design template, SERAD , which uses a combination of temporal and spatial redundancy to mitigate Single Event Transients (SETs) and upsets (SEUs). SERAD uses Error Detecting Logic (EDL) to detect SETs at the inputs of sequential elements and correct them via re-sampling. Because SERAD only pays the delay penalty in the presence of an SET, which rarely occurs, its average performance is comparable to the baseline synchronous design. We tested the SERAD design using a combination of Spice and Verilog simulations and evaluated its impact on area, frequency, and power on an open-core MIPS-like processor using a NCSU 45nm cell library. Our post-synthesis results show that the SERAD design consumes less than half of the area of the Triple Modular Redundancy (TMR), exhibits significantly less performance degradation than Glitch Filtering (GF), and consumes no more total power than the baseline unhardened design.
dc.description.statementofresponsibility by Sai Aparna Aketi, Smriti Gupta, Huimei Cheng, Joycee Mekie and Peter A. Beerel
dc.format.extent vol. 67, no. 5, pp. 1667-1677
dc.language.iso en_US en_US
dc.publisher Institute of Electrical and Electronics Engineers en_US
dc.subject Radiation hardening (electronics) en_US
dc.subject asynchronous circuits en_US
dc.subject error detection and correction en_US
dc.subject Single Event Transient (SET) en_US
dc.subject Single Event Upset (SEU) en_US
dc.subject processor en_US
dc.title SERAD: Soft Error Resilient Asynchronous Design using a bundled data protocol en_US
dc.type Article en_US
dc.relation.journal IEEE Transactions on Circuits and Systems I: Regular Papers


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