| dc.contributor.author |
Surana, Neelam |
|
| dc.contributor.author |
Lavania, Mili |
|
| dc.contributor.author |
Barma, Abhishek |
|
| dc.contributor.author |
Mekie, Joycee |
|
| dc.contributor.other |
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
|
| dc.coverage.spatial |
Grenoble, FR |
|
| dc.date.accessioned |
2020-07-20T06:02:29Z |
|
| dc.date.available |
2020-07-20T06:02:29Z |
|
| dc.date.issued |
09-03-20 |
|
| dc.identifier.citation |
Surana, Neelam; Lavania, Mili; Barma, Abhishek and Mekie, Joycee, "Robust and high-performance 12-T interlocked SRAM for in-memory computing", in the 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, FR, Mar. 9-13, 2020. |
en_US |
| dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/5558 |
|
| dc.description.statementofresponsibility |
by Neelam Surana, Mili Lavania, Abhishek Barma and Joycee Mekie |
|
| dc.language.iso |
en_US |
en_US |
| dc.title |
Robust and high-performance 12-T interlocked SRAM for in-memory computing |
en_US |
| dc.type |
Article |
en_US |