Process induced threshold voltage variability in Ultra-Thin Body and Buried Oxide Fully Depleted Silicon on Insulator (UTBB FDSOI) transistors
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Process induced threshold voltage variability in Ultra-Thin Body and Buried Oxide Fully Depleted Silicon on Insulator (UTBB FDSOI) transistors
Verma, Ankit Kumar
URI:
https://repository.iitgn.ac.in/handle/123456789/7137
Date:
2021
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