| dc.contributor.author |
Gandus, Guido |
|
| dc.contributor.author |
Cao, Jiang |
|
| dc.contributor.author |
Agarwal, Tarun |
|
| dc.contributor.author |
Luisier, Mathieu |
|
| dc.contributor.author |
Lee, Youseung |
|
| dc.contributor.other |
68th Annual IEEE International Electron Devices Meeting (IEEE IEDM 2022) |
|
| dc.coverage.spatial |
United States of America |
|
| dc.date.accessioned |
2023-02-03T11:28:49Z |
|
| dc.date.available |
2023-02-03T11:28:49Z |
|
| dc.date.issued |
2022-12-03 |
|
| dc.identifier.citation |
Gandus, Guido; Cao, Jiang; Agarwal, Tarun; Luisier, Mathieu and Lee, Youseung, "Ab initio quantum transport simulations of defective devices based on 2-D materials via a projected-GW approach", in the 68th Annual IEEE International Electron Devices Meeting (IEEE IEDM 2022), San Francisco, US, Dec. 3-7, 2022. |
en_US |
| dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/8539 |
|
| dc.description.statementofresponsibility |
by Guido Gandus, Jiang Cao, Tarun Agarwal, Mathieu Luisier and Youseung Lee |
|
| dc.language.iso |
en_US |
en_US |
| dc.title |
Ab initio quantum transport simulations of defective devices based on 2-D materials via a projected-GW approach |
en_US |
| dc.type |
Conference Paper |
en_US |