| dc.contributor.author |
Prasad, Kailash |
|
| dc.contributor.author |
Shubham, Sai |
|
| dc.contributor.author |
Biswas, Aditya |
|
| dc.contributor.author |
Mekie, Joycee |
|
| dc.contributor.other |
Design, Automation and Test in Europe Conference (DATE 2023) |
|
| dc.coverage.spatial |
Belgium |
|
| dc.date.accessioned |
2023-07-04T07:45:11Z |
|
| dc.date.available |
2023-07-04T07:45:11Z |
|
| dc.date.issued |
2023-04-17 |
|
| dc.identifier.citation |
Prasad, Kailash; Shubham, Sai; Biswas, Aditya and Mekie, Joycee, "Process variation resilient current-domain analog in memory computing", in the Design, Automation and Test in Europe Conference (DATE 2023), Antwerp, BE, Apr. 17-19, 2023. |
|
| dc.identifier.uri |
https://repository.iitgn.ac.in/handle/123456789/8923 |
|
| dc.description.statementofresponsibility |
by Kailash Prasad, Sai Shubham, Aditya Biswas and Joycee Mekie |
|
| dc.language.iso |
en_US |
|
| dc.title |
Process variation resilient current-domain analog in memory computing |
|
| dc.type |
Conference Paper |
|