| dc.contributor.author | Panda, Emila | |
| dc.contributor.other | 19th International Conference on Thin Films (ICTF 2023) | |
| dc.coverage.spatial | Spain | |
| dc.date.accessioned | 2023-10-13T10:33:25Z | |
| dc.date.available | 2023-10-13T10:33:25Z | |
| dc.date.issued | 2023-09-26 | |
| dc.identifier.citation | Panda, Emila, "Defect-induced abnormalities in the bulk and surface electronic properties in semiconductor thin films", in the 19th International Conference on Thin Films (ICTF 2023), Burgos, ES, Sep. 26-29, 2023. | |
| dc.identifier.uri | https://repository.iitgn.ac.in/handle/123456789/9363 | |
| dc.description.statementofresponsibility | by Emila Panda | |
| dc.language.iso | en_US | |
| dc.title | Defect-induced abnormalities in the bulk and surface electronic properties in semiconductor thin films | |
| dc.type | Conference Paper |
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